XRD and XPS Specialist
Phil has a degree in Materials Science and a Ph.D. from Imperial College and has over 30 years experience in microstructural analysis; mainly in aerospace materials. His particular expertise is X-ray diffraction but he also has significant experience in electron microscopy and mechanical testing. Most of his working life has been spent at Farnborough (RAE through to QinetiQ) and he joined OMCS in October 2011 after a year with Oxford Instruments. At OMCS he is responsible for X-ray diffraction, surface analysis using X-ray photoelectron spectroscopy and scanning electron microscopy.