Agilent 5400 AFM
- High resolution imaging of surfaces
- Scanning range up to 80 µm x 80 µm
- Z range of up to 7 µm
- Vertical noise of 5 nm RMS
- Topography imaging using Contact Mode; TappingMode™
- Surface roughness analysis
- Force – distance analysis for local compliance
- Capability of imaging a surface dry or under liquid
- Lateral Force Microscopy (LFM)
