Atomic Force Microscopy


Agilent 5400 AFM

-  High resolution imaging of surfaces

-  Scanning range up to 80 µm x 80 µm

-  Z range of up to 7 µm

-  Vertical noise of 5 nm RMS

-  Topography imaging using Contact Mode; TappingMode™

-  Surface roughness analysis

-  Force – distance analysis for local compliance

-  Capability of imaging a surface dry or under liquid

-  Lateral Force Microscopy (LFM)


afm step
afm height measure