Veeco AutoProbe and Agilent 5400 AFM


Veeco AutoProbe AFM Capabilities

  • High resolution imaging of surfaces (from atomic resolution to 100 x 100 micron areas)
  • Topography imaging using Contact Mode; TappingMode™
  • Surface roughness analysis
  • Force – distance analysis for local compliance
  • Lateral Force Microscopy (LFM)

Agilent 5400 AFM/SPM